Six Keynote Presentations on AI & Digital Transformation in Metrology
Six keynote presentations from the third Forum on Metrology and Digitalization (FORUM-MD), held at the BIPM in Sèvres, are now available on the BIPM's official YouTube channel. The recordings cover machine-actionable data, Digital Calibration Certificates (DCCs), and the role of metrology in supporting trustworthy artificial intelligence.
Keynote speakers:
- Martina Paul (ISO/IEC JTC 1/SC 42 JWG 6) — conformity assessment schemes for AI systems
- Thomas Doms (AIQI, TÜV Austria) — test and certification of safety-relevant AI applications
- Rania Wazir (NoLeFa, leiwand.ai) — metrics and data for testing of AI systems
- Rodolfo Souza (INMETRO, Brazil) — Smart Documents Vision
- Dong-Hun Ryu (KTL, Korea) — AI-driven calibration certificate application
- Jeff Gust (Fluke, USA) — application of AI in metrology
"Metrology brings confidence to measurement data through careful definition of what is being measured, calibration and traceability to national standards, and the evaluation of uncertainty." These same principles can be applied to AI systems — by ensuring test and training data are traceable, that testing addresses clearly defined risks, and that model outputs are accompanied by appropriate uncertainty evaluations. — Louise Wright, Chair, FORUM-MD Task Group on Safe and Trustworthy AI, NPL
"Measurement results are no longer limited to values, units, and uncertainties, but include comprehensive contextual and semantic information. In the real field, this enables more efficient calibration-dependent processes, reduces human error, saves time, and supports advanced applications such as AI-driven analysis, digital twins and many others." — Martin Koval, Czech Metrology Institute (CMI)
"Digital transformation not only boosts trust but also enhances efficiency, even for practical and administrative tasks." — Peter Blattner, Chief Metrology Officer, METAS
A central theme was the alignment of the SI Digital Framework (SIDF), the SI Reference Point (SIRP), and the Key Comparison Database (KCDB) to support consistent, machine-readable exchange of measurement data. Next FORUM-MD meeting: February 2027, BIPM Sèvres.
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